
The first control program
Windows Forms: a table of fields, each with its own position and exposure time — dose sweeps set up by hand.
Photolithography straight from a layout file. No photomasks, no mask aligner, no waiting — a design change is a file change.
Two machines, one line of work. Prototype 1.0 is built and working: it exposes real wafers today and runs software written in-house. Prototype 2.0 turns what it taught me into a modular sub-micron motion platform, with lithography as its first instrument.
Built and working
The machine that proved the idea. Enclosed desktop unit: DMD projection head, 440 nm LED, closed-loop XY stage on servo drives and optical scales, a camera looking through the same objective. It exposes resist on real wafers.



A TI DLP4710 DMD — 1920 × 1080 micromirrors — is a programmable photomask. Each frame of the layout is projected through a microscope objective onto the resist; the stage steps and stitches frames into one continuous pattern.


Photographs, not simulations: exposed and developed on Prototype 1.0.




Sub-micron precision here does not come from granite and air bearings. The machine measures its own geometry and illumination with a camera in the wafer plane and cancels them on every field; the software refuses to expose with an uncalibrated objective.

Mechanics, optics, electronics and software — designed, built and brought to working condition by one person.
Modular platform · CAD stage
A precision 3-axis motion platform first; lithography is one configuration of it. Three identical linear modules make the XYZ gantry, and everything above the stage bolts to a standard optical-breadboard grid.
Renders with dots are interactive: hover over or tap a part to see what it does.

Every axis is the same block: servo drive, ball screw, crossed-roller guides and an optical scale, closed-loop and complete in itself — 100 nm as standard, 2.5 nm as an option. A product line of its own.





What changes against Prototype 1.0: an open gantry instead of a box, and every part of the optical path made swappable.

Prototype 2.0. The optical core and software are carried over from Prototype 1.0.
Today it is a single-layer tool: expose, develop, done. If your process needs aligned multilayer now, ask me about the timeline.
Drag the divider. On the left is the GDSII file that went to the machine; on the right, a photograph of what came out, corrected for perspective so the two line up.
The silicon chip is 25 × 25 mm; the layout on it, a logo with captions and four dithered pictures, takes 20 × 20 mm. One exposure job.
The machine exposes one DMD frame at a time: this chip is 1 869 fields of 0.25 × 0.38 mm, placed side by side by the stage. Switch the picture to Exposure fields and back, and look for the seams.
What ends up in resist depends on development as much as on exposure: developer, time and temperature all change the result. These are samples from process tuning. Works by Magritte and Escher are blurred on both sides: they are still under copyright.
Fine-line boards and flex circuits, straight from the layout — same-day iteration.
Channel networks, master molds for PDMS, on-chip electrodes.
Resist patterns for etching, lift-off and plating on Si up to 4″.
Gratings, diffractive elements, waveguide test structures.
On-chip test cells, microelectrode platforms, microbatteries.
No laser class, compact, enclosed — real workflows from GDSII to wafer.
No third-party CAM chain, no licence dependencies. MVP level: everything below runs on the tool today.

A camera goes on the stage with its sensor facing up, in the plane where the wafer would be. The projector then draws straight onto the sensor, so the software sees exactly what the resist would get — and measures geometry, dose and stitching from it. The same procedure carries over to Prototype 2.0.
The payoff: tolerances move from hardware into software. Parts, rails and optics do not have to be perfect, and the machine does not have to be assembled perfectly — whatever is left is measured and cancelled. That keeps the parts cheaper and the build simpler.
Drag the divider. Measured sides are camera frames taken in the wafer plane (one sensor pixel is 3.75 µm on the substrate). The compensated side of the white field illustrates the correction algorithm on that same frame.
One square frame exposed at 25 stage positions and stacked into one image. Before: projector rotation against the stage and the rails’ shear show as tilted squares with uneven gaps. After: every move goes through the measured 2 × 2 correction.
Projector rotation against the stage, the shear between the X and Y rails and the scale of each axis are measured together and applied to every move. Sub-micron placement at the edge of a 100 mm wafer needs the angle to about 4 arcseconds.
The camera maps illumination across the field; the software turns it into an attenuation mask on the DMD and adjusts exposure time per tile. The camera then measures the result again, and the mask is refined until the field is flat to within 2–3 %.


| Objective | Before | After | Darkest vs brightest |
|---|---|---|---|
| 10× | 48.7 % | 97.8 % | −2.2 % |
| 20× | 63.0 % | 97.9 % | −2.1 % |
| 40× | 70.0 % | 97.2 % | −2.8 % |
Uniformity here is the dimmest 2 % of the field — or the darkest corner, whichever is worse — over the brightest 2 %, measured through the objective and averaged over 256 frames. Each objective gets its own mask, refined pass by pass until a pass stops improving it. July–August 2026.

A year of iterations. The pre-alpha ran on a different projector with a first program written in Windows Forms; Prototype 1.0 got its own stage, its own software and a stitched exposure process.

Windows Forms: a table of fields, each with its own position and exposure time — dose sweeps set up by hand.
Test arrays in resist, each exposed in a single projected field with no stitching, labelled with its own exposure settings.

The XY stage on a milling machine: the rotary platform fitted and the mounting plane machined level.
Its own stage on servo drives and optical scales, the QtLithoCAN software, autofocus and a height map, jobs stitched across whole wafers — everything above on this page.
A test chip made of 1 869 exposure fields shows no visible seams.
On the table: a working Prototype 1.0, the Prototype 2.0 design, full documentation and in-house software. A partner brings production, supply chain and market access; deal structure and investment size are open. Demonstrations and sample exposures by arrangement.